For almost 20 years, researchers and semiconductormanufacturers have been trying to developa practical analog BIST (built-in self-test) formixed-signal ICs. By enabling mixed-signal ICtesting on ...
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Return to original Test Digest book review. VLSI Test Principles and Architectures: Design for Testability, Laung-Terng Wang, Chen-Wen Wu, and Xiaoquing Wen (editors), Elsevier Science ...
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